Mapping of absorption in optical coatings

Steve E. Watkins; Robert Heimlich; Robert Reis Jr.

doi:10.1117/12.60110

29 July 1992 Mapping of absorption in optical coatings

Steve E. Watkins, Robert Heimlich, Robert Reis Jr.

Proceedings Volume 1624, Laser-Induced Damage in Optical Materials: 1991; (1992) https://doi.org/10.1117/12.60110
Event: Laser-Induced Damage in Optical Materials: 1991, 1991, Boulder, CO, United States

Abstract

Absorption characteristics of optical coatings have been observed using infrared photothermal radiometry as a noncontact diagnostic technique. The local laser-induced temperature rise was measured as a function of position on the coatings. The data was used to calculate the absorption of the coatings and to identify point sites with atypical absorption. The coating samples were tantala/silica multilayers designed to be high reflectors at 1.32 micrometers . The tests were done with a 1.32 micrometers , continuous-wave Nd:YAG laser and a HgCdTe infrared camera.

Citation Download Citation

Steve E. Watkins, Robert Heimlich, and Robert Reis Jr. "Mapping of absorption in optical coatings", Proc. SPIE 1624, Laser-Induced Damage in Optical Materials: 1991, (29 July 1992); https://doi.org/10.1117/12.60110

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