Paper
1 May 1992 Light scattering Mueller matrix for a surface contaminated by a single particle in the Rayleigh limit
Roger S. Vickers, Victor H. Gonzalez, Robert W. Ficklin
Author Affiliations +
Proceedings Volume 1631, Ultrawideband Radar; (1992) https://doi.org/10.1117/12.59043
Event: OE/LASE '92, 1992, Los Angeles, CA, United States
Abstract
A ray-tracing model was used to derive the light scattering Mueller matrix element curves for a dipole near a perfect surface as a function of incident angle, scattering angle, and surface refractive index. This system represents a fundamental system composed of a perfect plane surface and a perfect (Rayleigh) scatterer.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Roger S. Vickers, Victor H. Gonzalez, and Robert W. Ficklin "Light scattering Mueller matrix for a surface contaminated by a single particle in the Rayleigh limit", Proc. SPIE 1631, Ultrawideband Radar, (1 May 1992); https://doi.org/10.1117/12.59043
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Cited by 8 scholarly publications.
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KEYWORDS
Radar

Synthetic aperture radar

Antennas

Image resolution

Data processing

Data acquisition

Fourier transforms

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