Paper
1 June 1992 Phase and transmission error study for the alternating-element (Levenson) phase-shifting mask
Ahmad D. Katnani, Burn Jeng Lin
Author Affiliations +
Abstract
Despite the potential of phase shifting masks to extend projection optical imaging to higher resolution or lower ki, several issues remain to be investigated before the technology can be fully used. This paper addresses the effects of phase and transmission errors on the alternating-element phase shifting method, otherwise known as the Levenson technique, for printing closely packed lines and spaces. Aerial image simulation is used to generate exposure-defocus trees and the normalized depth of focus k2 is used as the criteria based on given assumptions of linewidth tolerance and exposure allowance. Response surfaces are generated to define the tolerance limit for the phase and the transmission errors which affect both the depth of focus and the center focus. The dependency of these errors on ki, A, and NA are discussed.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ahmad D. Katnani and Burn Jeng Lin "Phase and transmission error study for the alternating-element (Levenson) phase-shifting mask", Proc. SPIE 1674, Optical/Laser Microlithography V, (1 June 1992); https://doi.org/10.1117/12.130326
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CITATIONS
Cited by 5 scholarly publications and 1 patent.
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KEYWORDS
Tolerancing

Phase shifts

Phase shifting

Optical lithography

Thin films

Error analysis

Photomasks

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