Analysis Of Interferograms From Waxicons

John S. Loomis

doi:10.1117/12.957046

4 April 1979 Analysis Of Interferograms From Waxicons

John S. Loomis

Proceedings Volume 0171, Optical Components: Manufacture and Evaluation; (1979) https://doi.org/10.1117/12.957046
Event: Los Angeles Technical Symposium, 1979, Los Angeles, United States

Abstract

Axicon elements are used in cylindrical optical systems such as high-power chemical lasers. Interferometric tests of such elements cannot be interpreted by standard methods. Axicon aberrations of cone error and decenter error are defined to help interpret such interferograms. A preprocessing option was added to FRINGE to treat axicon data. An example interferogram has been analyzed.

Citation Download Citation

John S. Loomis "Analysis Of Interferograms From Waxicons", Proc. SPIE 0171, Optical Components: Manufacture and Evaluation, (4 April 1979); https://doi.org/10.1117/12.957046

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