Paper
13 January 1993 Design of the second-generation scanning photoemission microscope at the National Synchrotron Light Source
Cheng-Hao Ko, Harald Ade, Janos Kirz, Erik D. Johnson, Steven L. Hulbert, Erik H. Anderson, Dieter P. Kern
Author Affiliations +
Abstract
During the past few years, we have built and commissioned a scanning photoemission microscope (X1-SPEM). It was the first photoemission microscope to achieve submicron resolution. To improve the performance, we are designing a second generation instrument. The major changes in the instrument are the replacement of the home-made single pass cylindrical mirror analyzer (CMA) with a hemispherical sector analyzer (HSA) and the construction of a new chamber with a scheme to manipulate the zone plate and the order sorting aperture (OSA) with more flexibility. The design concepts and expected performance of the instrument are discussed.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cheng-Hao Ko, Harald Ade, Janos Kirz, Erik D. Johnson, Steven L. Hulbert, Erik H. Anderson, and Dieter P. Kern "Design of the second-generation scanning photoemission microscope at the National Synchrotron Light Source", Proc. SPIE 1741, Soft X-Ray Microscopy, (13 January 1993); https://doi.org/10.1117/12.138745
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Cited by 3 scholarly publications.
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KEYWORDS
Zone plates

Mirrors

Microscopes

Light sources

Monochromators

Oxygen

Synchrotrons

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