Intensity distribution of the x-ray source for the AXAF VETA-I mirror test

Ping Zhao; Edwin M. Kellogg; Daniel A. Schwartz; Y. Shao; Melinda Ann Fulton

doi:10.1117/12.140579

21 January 1993 Intensity distribution of the x-ray source for the AXAF VETA-I mirror test

Ping Zhao, Edwin M. Kellogg, Daniel A. Schwartz, Y. Shao, Melinda Ann Fulton

Proceedings Volume 1742, Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography; (1993) https://doi.org/10.1117/12.140579
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

Intensity distribution measurements of the X-ray source for the AXAF VETA-I mirror test are reported. During the VETA-I test, microscope pictures were taken for each used anode immediately after it was brought out of the source chamber. The source sizes and the intensity distribution structures are shown. They are compared and shown to agree with the results from pinhole camera measurements. It is demonstrated that under operating conditions characteristic of the VETA-I test, all the source sizes have an FWHM of less than 0.45 mm. For a source of this size at 528 m away, the angular size to VETA is less than 0.17 arcsec, which is small compared to the on-ground VETA angular resolution. These results were crucial for VETA data analysis and for obtaining the on-ground and predicted in-orbit VETA point response function.

Citation Download Citation

Ping Zhao, Edwin M. Kellogg, Daniel A. Schwartz, Y. Shao, and Melinda Ann Fulton "Intensity distribution of the x-ray source for the AXAF VETA-I mirror test", Proc. SPIE 1742, Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography, (21 January 1993); https://doi.org/10.1117/12.140579

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