Paper
11 December 1992 Polarized light-scattering applications and measurements of fundamental systems
William S. Bickel, Gorden W. Videen
Author Affiliations +
Abstract
We discuss scattering in the context of the Stokes vectors and Mueller matrices that completely characterize the polarization state of the scattered light. A polar nephelometer is used to measure the light scattering Mueller matrix elements of various ideal systems. These systems are fundamental and solvable theoretically. The scattering systems can be perturbed and the amount of perturbation can be quantified. The light-scattering signals can then be examined as a function of the amount of perturbation. Eventually, the perturbation dominates the system so that the addition of more of the perturbation does not significantly alter the appearance of the scattering system or of the polarized light scattering signals. These saturated systems may also be thought of as fundamental systems. In this paper we examine some fundamental systems and discuss models which predict the polarization state of some highly perturbed scattering systems.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William S. Bickel and Gorden W. Videen "Polarized light-scattering applications and measurements of fundamental systems", Proc. SPIE 1746, Polarization Analysis and Measurement, (11 December 1992); https://doi.org/10.1117/12.138784
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KEYWORDS
Scattering

Light scattering

Polarization

Optical spheres

Polarization analysis

Particles

Rayleigh scattering

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