Vector formulation for interferogram surface fitting

David J. Fischer; John T. O'Bryan; H. Philip Stahl

doi:10.1117/12.140942

2 September 1992 Vector formulation for interferogram surface fitting

David J. Fischer, John T. O'Bryan, H. Philip Stahl

Proceedings Volume 1779, Optical Design and Processing Technologies and Applications; (1992) https://doi.org/10.1117/12.140942
Event: Optical Engineering Midwest 1992, 1992, Chicago, IL, United States

Abstract

Interferometry is an optical testing technique based on the interference of light. Fringes are formed when the optical path difference (OPD) between a reference beam and an object beam is an integral multiple of the illuminating wavelength. This OPD is extracted through the process of sampling, ordering, and interpolating. This paper develops a linear-algebra vector notation model of the interferogram sampling and interpolation process.

Citation Download Citation

David J. Fischer, John T. O'Bryan, and H. Philip Stahl "Vector formulation for interferogram surface fitting", Proc. SPIE 1779, Optical Design and Processing Technologies and Applications, (2 September 1992); https://doi.org/10.1117/12.140942

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