Measuring Method Of Quality Of Luster: Measurement And Analysis Of Microstructural Reflection Characteristics

Masao Sawaji

doi:10.1117/12.957366

10 October 1979 Measuring Method Of Quality Of Luster: Measurement And Analysis Of Microstructural Reflection Characteristics

Masao Sawaji

Author Affiliations +

Proceedings Volume 0182, Imaging Applications for Automated Industrial Inspection and Assembly; (1979) https://doi.org/10.1117/12.957366
Event: Technical Symposium East, 1979, Washington, D.C., United States

Abstract

In the luster mensuration, luster is usually measured without differentiating its quality and quantity. The author discriminates the one from the other as Quality of luster ; the characteristics based upon the distribution of reflection from parts of surface which are very small to the extent that the resolving power of the eye comes into question. Quantity of luster ; the macroscopic characteristics based upon the average reflection from a reasonably large area of the surface which is regarded as uniform in luster. On this basis, an automatic recording "microlustermeter" has been devised to measure the quality of luster and an analytical formula is derived for the recorded curve to show the evaluation of the quality of luster. We apply this measuring method for evaluation to the metalic twinkling painted surface, the luster of the silk and cotton textiles, and the some materials have different texture.

Citation Download Citation

Masao Sawaji "Measuring Method Of Quality Of Luster: Measurement And Analysis Of Microstructural Reflection Characteristics", Proc. SPIE 0182, Imaging Applications for Automated Industrial Inspection and Assembly, (10 October 1979); https://doi.org/10.1117/12.957366

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