Scanning tunneling and force microscopies of low-dimensional organic conductors and superconductors

Raul Fainchtein; S. T. D'Arcangelis; S. S. Yang; D. O. Cowan; Sangyol Yoon; S. H. Pan; W. F. Smith; M. Yoo; Alejandro L. de Lozanne

doi:10.1117/12.146369

4 June 1993 Scanning tunneling and force microscopies of low-dimensional organic conductors and superconductors

Raul Fainchtein, S. T. D'Arcangelis, S. S. Yang, D. O. Cowan, Sangyol Yoon, S. H. Pan, W. F. Smith, M. Yoo, Alejandro L. de Lozanne

Author Affiliations +

Proceedings Volume 1855, Scanning Probe Microscopies II; (1993) https://doi.org/10.1117/12.146369
Event: OE/LASE'93: Optics, Electro-Optics, and Laser Applications in Scienceand Engineering, 1993, Los Angeles, CA, United States

Abstract

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) have been successfully applied to investigate the surface structure and the electron density of states of organic conductors and superconductors. The structural nature of organic conductors and superconductors makes their transport properties susceptible to one-dimensional effects. Low- dimensionality effects in the electrical conductivity of these materials are investigated using scanning tunneling microscopy at room and low temperatures. Effects such as charge density waves and Peierls instabilities are directly observed with the STM. The consequences of low- dimensionality in the electrical conductivity of these materials will be presented.

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Raul Fainchtein, S. T. D'Arcangelis, S. S. Yang, D. O. Cowan, Sangyol Yoon, S. H. Pan, W. F. Smith, M. Yoo, and Alejandro L. de Lozanne "Scanning tunneling and force microscopies of low-dimensional organic conductors and superconductors", Proc. SPIE 1855, Scanning Probe Microscopies II, (4 June 1993); https://doi.org/10.1117/12.146369

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