Far-field pattern measurement of on-board laser communication equipment by free-space laser transmission simulator

Keizo Inagaki; Mitsuo Nohara; Yoshinori Arimoto; Masayuki Fujise; Yoji Furuhama; Seiji Kanda; Kenichi Araki

doi:10.1117/12.149258

6 August 1993 Far-field pattern measurement of on-board laser communication equipment by free-space laser transmission simulator

Keizo Inagaki, Mitsuo Nohara, Yoshinori Arimoto, Masayuki Fujise, Yoji Furuhama, Seiji Kanda, Kenichi Araki

Author Affiliations +

Proceedings Volume 1866, Free-Space Laser Communication Technologies V; (1993) https://doi.org/10.1117/12.149258
Event: OE/LASE'93: Optics, Electro-Optics, and Laser Applications in Scienceand Engineering, 1993, Los Angeles, CA, United States

Abstract

We measured far-field patterns of on-board laser communication equipment (LCE) using a free-space laser transmission simulator. The LCE was developed by Communications Research Laboratories (CRL) for basic optical communications experiments using the Japan's Engineering Test Satellite-VI (ETS-VI), while the free-space simulator is being developed by ATR as an on-ground test system for laser communication terminals. Far-field patterns of an on-board laser communication terminal have measured experimentally by an on-ground test system for the first time. The LCE emitted a laser beam whose peak directive gain was 104.6 dB and whose beamwidth was 31 X 19 (mu) rad in full-width at half-maximum. It was confirmed that the transmitted beam of the LCE met the experimental requirements. Through the measurement, the free-space laser transmission simulator demonstrated its effectiveness in an on-ground measurement of the beam characteristics of a laser communication terminal.

Citation Download Citation

Keizo Inagaki, Mitsuo Nohara, Yoshinori Arimoto, Masayuki Fujise, Yoji Furuhama, Seiji Kanda, and Kenichi Araki "Far-field pattern measurement of on-board laser communication equipment by free-space laser transmission simulator", Proc. SPIE 1866, Free-Space Laser Communication Technologies V, (6 August 1993); https://doi.org/10.1117/12.149258

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