X-ray analysis on ferroelectric and antiferroelectric liquid crystals

Yoichi Takanishi; Asako Ikeda; Hideo Takezoe; Atsuo Fukuda

doi:10.1117/12.151205

13 August 1993 X-ray analysis on ferroelectric and antiferroelectric liquid crystals

Yoichi Takanishi, Asako Ikeda, Hideo Takezoe, Atsuo Fukuda

Proceedings Volume 1911, Liquid Crystal Materials, Devices, and Applications II; (1993) https://doi.org/10.1117/12.151205
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1993, San Jose, CA, United States

Abstract

We measured the first and the higher order Bragg peaks corresponding to the layer thickness in the SmC and SmC_A phases by X-ray diffraction, and calculated the smectic order parameters of the two phases. We found that the smectic layer in the SmC_A phase is much more ordered than that in the SmC phase.

Citation Download Citation

Yoichi Takanishi, Asako Ikeda, Hideo Takezoe, and Atsuo Fukuda "X-ray analysis on ferroelectric and antiferroelectric liquid crystals", Proc. SPIE 1911, Liquid Crystal Materials, Devices, and Applications II, (13 August 1993); https://doi.org/10.1117/12.151205

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