TS: a test-split algorithm for inductive learning

Xindong Wu

doi:10.1117/12.150598

1 September 1993 TS: a test-split algorithm for inductive learning

Xindong Wu

Proceedings Volume 1962, Adaptive and Learning Systems II; (1993) https://doi.org/10.1117/12.150598
Event: Optical Engineering and Photonics in Aerospace Sensing, 1993, Orlando, FL, United States

Abstract

This paper presents a new attribute-based learning algorithm, TS. Different from ID3, AQ11, and HCV in strategies, this algorithm operates in cycles of test and split. It uses those attribute values which occur only in positives but not in negatives to straightforwardly discriminate positives against negatives and chooses the attributes with least number of different values to split example sets. TS is natural, easy to implement, and low-order polynomial in time complexity.

Citation Download Citation

Xindong Wu "TS: a test-split algorithm for inductive learning", Proc. SPIE 1962, Adaptive and Learning Systems II, (1 September 1993); https://doi.org/10.1117/12.150598

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