Measurement system for scanner angular linearity

Li Wang; Haochen Liang; Wei-Li Qiu

doi:10.1117/12.142035

1 April 1993 Measurement system for scanner angular linearity

Li Wang, Haochen Liang, Wei-Li Qiu

Proceedings Volume 1982, Photoelectronic Detection and Imaging: Technology and Applications '93; (1993) https://doi.org/10.1117/12.142035
Event: Photoelectronic Detection and Imaging: Technology and Applications '93, 1993, Beijing, China

Abstract

This paper describes a measurement system for scanner linearity of angle vs. time. Because the techniques of pinhole filter, high-speed data acquisition, and CCD elaborate division have been successfully used, the system has a high measurement accuracy (2 micrometers ) and powerful data processing capacity.

Citation Download Citation

Li Wang, Haochen Liang, and Wei-Li Qiu "Measurement system for scanner angular linearity", Proc. SPIE 1982, Photoelectronic Detection and Imaging: Technology and Applications '93, (1 April 1993); https://doi.org/10.1117/12.142035

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