Gain uniformity, linearity, saturation, and depletion in gated microchannel-plate x-ray framing cameras

Otto L. Landen; Perry M. Bell; John A. Oertel; Joseph J. Satariano; David K. Bradley

doi:10.1117/12.161355

11 October 1993 Gain uniformity, linearity, saturation, and depletion in gated microchannel-plate x-ray framing cameras

Otto L. Landen, Perry M. Bell, John A. Oertel, Joseph J. Satariano, David K. Bradley

Proceedings Volume 2002, Ultrahigh- and High-Speed Photography, Videography, and Photonics '93; (1993) https://doi.org/10.1117/12.161355
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

The pulsed characteristics of gated, microstrip configuration microchannel-plate (MCP) detectors used in x-ray framing cameras deployed on laser plasma experiments worldwide are examined in greater detail. The detectors are calibrated using short (20 ps) and long (500 ps) pulse x-ray irradiation and 3 - 60 ps, deep UV (202 and 213 nm), spatially-smoothed laser irradiation. Two-dimensional unsaturated gain profiles show < 5% long-range transverse variations but up to 3 dB/cm drop in gain parallel to the pulse propagation direction. Up to 50% gain enhancements due to voltage reflection from the bends of a meander stripline geometry and from the ends of conventional straight striplines are also observed. Reproducible gate profiles are obtained with either picosecond x-ray or UV bursts and FWHM extracted with 3 picosecond accuracy. A novel single-shot method for measuring local gate propagation speeds using a tilted MCP is also demonstrated.

Citation Download Citation

Otto L. Landen, Perry M. Bell, John A. Oertel, Joseph J. Satariano, and David K. Bradley "Gain uniformity, linearity, saturation, and depletion in gated microchannel-plate x-ray framing cameras", Proc. SPIE 2002, Ultrahigh- and High-Speed Photography, Videography, and Photonics '93, (11 October 1993); https://doi.org/10.1117/12.161355

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