Toward the characterization of infrared cameras

Alexis P. Tzannes; Jonathan Martin Mooney

doi:10.1117/12.160567

1 November 1993 Toward the characterization of infrared cameras

Alexis P. Tzannes, Jonathan Martin Mooney

Proceedings Volume 2020, Infrared Technology XIX; (1993) https://doi.org/10.1117/12.160567
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

This work focuses on characterizing the performance of various staring PtSi infrared cameras, based on estimating their spatial frequency response. Applying a modified knife edge technique, we arrive at an estimate of the edge spread function (ESF), which is used to obtain a profile through the center of the two-dimensional Modulation Transfer Function (MTF). The MTF of various cameras in the horizontal and vertical direction is measured and compared to the ideal system MTF. The influence of charge transfer efficiency (CTE) on the knife edge measurement and resulting MTF is also modeled and discussed. An estimate of the CTE can actually be obtained from the shape of the ESF in the horizontal direction. The effect of pixel fill factor on the estimated MTF in the horizontal and vertical directions is compared and explained.

Citation Download Citation

Alexis P. Tzannes and Jonathan Martin Mooney "Toward the characterization of infrared cameras", Proc. SPIE 2020, Infrared Technology XIX, (1 November 1993); https://doi.org/10.1117/12.160567

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