Paper
21 January 1994 Enhanced barrier height GaInAs MSM Schottky barrier photodiodes
S. V. Averin, A. Kohl, A. Mesquida Kusters, Klaus Heime
Author Affiliations +
Proceedings Volume 2051, International Conference on Optical Information Processing; (1994) https://doi.org/10.1117/12.165991
Event: Optical Information Processing: International Conference, 1993, St. Petersburg, Russian Federation
Abstract
The p+-cap layer of InP together with 80 nm of undoped (Nb equals 5 1014 cm-3) assist layer of InP for the first time were used to increase the Schottky barrier height (up to 0.73 e.V.) on GaInAs and to create high speed MSM photodetectors on it. The average dark current density is 1.6 10-4 A/cm2 -- the lowest known value on the GaInAs semiconductor material. A rise time of 37 ps for the impulse response at (lambda) equals 1.3 micrometers was measured for a MSM diode with 2 micrometers fingers and 2 micrometers gaps and an active area of 30 X 30 micrometers 2.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. V. Averin, A. Kohl, A. Mesquida Kusters, and Klaus Heime "Enhanced barrier height GaInAs MSM Schottky barrier photodiodes", Proc. SPIE 2051, International Conference on Optical Information Processing, (21 January 1994); https://doi.org/10.1117/12.165991
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KEYWORDS
Photodiodes

Diodes

Integrated optics

Picosecond phenomena

Metals

Photodetectors

Semiconducting wafers

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