Characterization of materials by submillimeter multibeam techniques

B. P. Gorshunov

doi:10.1117/12.2298513

30 August 1993 Characterization of materials by submillimeter multibeam techniques

B. P. Gorshunov

Proceedings Volume 2104, 18th International Conference on Infrared and Millimeter Waves; 210429 (1993) https://doi.org/10.1117/12.2298513
Event: 18th International Conference on Infrared and Millimeter Waves, 1993, Colchester, United Kingdom

Abstract

Use of different multilayer resonance structures in quasioptical submillimeter (SBMM) spectroscopy gives anÃ¢â‚¬Â¢ffective way of increasing the sensitivity of measuring schemes due to multiple interaction of the testing radiationwith the sample. We present below three main kinds of interferometric structures used in SBMM quasiopticalspectroscopy which allow direct determination of any optical constant of the sample.

Citation Download Citation

B. P. Gorshunov "Characterization of materials by submillimeter multibeam techniques", Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 210429 (30 August 1993); https://doi.org/10.1117/12.2298513

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