Metrology for spatial interferometry

Yekta Gursel

doi:10.1117/12.177268

9 June 1994 Metrology for spatial interferometry

Yekta Gursel

Proceedings Volume 2200, Amplitude and Intensity Spatial Interferometry II; (1994) https://doi.org/10.1117/12.177268
Event: 1994 Symposium on Astronomical Telescopes and Instrumentation for the 21st Century, 1994, Kailua, Kona, HI, United States

Abstract

The accuracy of the relative metrology gauge developed for the proposed OSI and SONATA missions is improved to subpicometer level. An accuracy of 0.15 picometers is obtained in vacuum at time scales of a few minutes. A surface metrology gauge with an initial accuracy of (lambda) /1000 is under construction. Photometry accurate to better than 1 part in 10³ for the surface metrology gauge is demonstrated using a commercial grade, 8-bit, uncooled CCD camera and a commercial grade frame grabber at time scales of 10 seconds with a resolution of 320 by 240 pixels.

Citation Download Citation

Yekta Gursel "Metrology for spatial interferometry", Proc. SPIE 2200, Amplitude and Intensity Spatial Interferometry II, (9 June 1994); https://doi.org/10.1117/12.177268

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