Paper
19 August 1994 Y-Ba-Cu-O microstrip resonators on sapphire substrates
Oleg Pustylnik, Alexander D. Dymnikov, Igor V. Voinovsky, Oleg A. Khymenko
Author Affiliations +
Proceedings Volume 2211, Millimeter and Submillimeter Waves; (1994) https://doi.org/10.1117/12.183066
Event: Millimeter and Submillimeter Waves and Applications: International Conference, 1994, San Diego, CA, United States
Abstract
We have measured very low microwave losses in Y-Ba-Cu-O fifth wave ring resonators. We deposited the Y-Ba-Cu-O film on (1012) non-buffered sapphire substrates and patterned microwave circuits. High-Tc microstrip resonators demonstrated best Q-factor greater then 800 at 31 GHz, corresponding to surface resistances less than 3,0 mOhm. Identical copper resonator showed Qs of 500 and surface resistance of 27 mOhm. We show that the losses in the high loss samples can be accounted for by the presence of small fractions of c- axis-aligned grains highly misapplied in the plane of those films. Volume fraction of highly misagned c-axis-oriented grains as 3% lead to losses above 3 mOhm.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oleg Pustylnik, Alexander D. Dymnikov, Igor V. Voinovsky, and Oleg A. Khymenko "Y-Ba-Cu-O microstrip resonators on sapphire substrates", Proc. SPIE 2211, Millimeter and Submillimeter Waves, (19 August 1994); https://doi.org/10.1117/12.183066
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KEYWORDS
Resonators

Copper

Microwave radiation

Sapphire

Resistance

Temperature metrology

Helium

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