High sensitivity fringe projection micro-shape measurement system

Maria Pirga; Malgorzata Kujawinska

doi:10.1117/12.194316

15 November 1994 High sensitivity fringe projection micro-shape measurement system

Maria Pirga, Malgorzata Kujawinska

Proceedings Volume 2248, Optical Measurements and Sensors for the Process Industries; (1994) https://doi.org/10.1117/12.194316
Event: Optics for Productivity in Manufacturing, 1994, Frankfurt, Germany

Abstract

The high sensitivity fringe projection automated system for shape measurement of the object with P-V ranging from 10 - 2000 micrometers is presented. The system uses the carrier-frequency phase-shifting fringe pattern analysis method which enables the proper shape determination on the basis of a single image. The system may be applied for the object with max. dimension up to 20 mm. The opto-mechanical arrangement uses white light and is not sensitive for vibrations and work in a hostile environment.

Citation Download Citation

Maria Pirga and Malgorzata Kujawinska "High sensitivity fringe projection micro-shape measurement system", Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); https://doi.org/10.1117/12.194316

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