Microwave technique for sizing finite cracks on metal surfaces using open-ended rectangular waveguides

Chin-Yung Yeh; Reza Zoughi

doi:10.1117/12.186708

14 September 1994 Microwave technique for sizing finite cracks on metal surfaces using open-ended rectangular waveguides

Chin-Yung Yeh, Reza Zoughi

Author Affiliations +

Proceedings Volume 2275, Advanced Microwave and Millimeter-Wave Detectors; (1994) https://doi.org/10.1117/12.186708
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

Two different microwave techniques for detecting fatigue or stress surface cracks in metals have been introduced. In both cases, an open-ended rectangular waveguide is used to scan over the metal surface under examination. Once a crack has been successfully detected, for both fracture analysis and repair considerations, sizing becomes the next important step. The models established for surface crack detection and their associated computer codes can be used to establish a useful crack sizing technique. The following describes a sizing technique for this purpose.

Citation Download Citation

Chin-Yung Yeh and Reza Zoughi "Microwave technique for sizing finite cracks on metal surfaces using open-ended rectangular waveguides", Proc. SPIE 2275, Advanced Microwave and Millimeter-Wave Detectors, (14 September 1994); https://doi.org/10.1117/12.186708

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available