Internal field distribution in CdTe detectors prepared from semi-insulating materials

Makram Hage-Ali; M. C. Busch; Jean Marie Koebel; Paul Siffert

doi:10.1117/12.187264

21 September 1994 Internal field distribution in CdTe detectors prepared from semi-insulating materials

Makram Hage-Ali, M. C. Busch, Jean Marie Koebel, Paul Siffert

Proceedings Volume 2305, Gamma-Ray Detector Physics and Applications; (1994) https://doi.org/10.1117/12.187264
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

Two electric field profile analysis methods have been considered for evaluating the internal field distribution in cadmium telluride nuclear radiation detectors. A theoretical model is given, followed by two experimental measurements, using the induced radiation current pulse profile and the optical rotation by the Pockels effect of polarized IR light. Finally, theoretical and experimental results are discussed.

Citation Download Citation

Makram Hage-Ali, M. C. Busch, Jean Marie Koebel, and Paul Siffert "Internal field distribution in CdTe detectors prepared from semi-insulating materials", Proc. SPIE 2305, Gamma-Ray Detector Physics and Applications, (21 September 1994); https://doi.org/10.1117/12.187264

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