Linear model of surface and scanner characterization method

Seong-Deok Lee; Chang-Yeong Kim; Yang-Seock Seo

doi:10.1117/12.206536

10 April 1995 Linear model of surface and scanner characterization method

Seong-Deok Lee, Chang-Yeong Kim, Yang-Seock Seo

Proceedings Volume 2414, Device-Independent Color Imaging II; (1995) https://doi.org/10.1117/12.206536
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1995, San Jose, CA, United States

Abstract

In color reproduction research, a linear model designed to minimize the error between original surface reflectance spectra and reproduced spectra is useful in the process of producing an accurate color match between the original image and reproduction under a variety of illuminants, but it is inappropriate in efficiency. We propose an efficient linear model based on surface reflectance spectra and a unified wavelength function of CIE 1931 standard observer representing human perceptual property. The surface spectra weighted with the unified wavelength function were introduced to minimize the human perceptual error between original reflectance spectra and reproduced spectra and to reduce the number of the spectral basis functions. The performance of reflectance spectra-to-CIELAB transformation on our proposed linear model is tested and compared with a conventional model based on reflectance spectra under a variety of illuminants. The results of our linear model is superior to that of the conventional model. With Munsell 400 color patches, D65 illuminant and 4-dimensional linear model, the mean color difference of our model is 1.28 CIELAB unit. And an algorithm for color scanner characterization using our model is made and tested, and the results are shown.

Citation Download Citation

Seong-Deok Lee, Chang-Yeong Kim, and Yang-Seock Seo "Linear model of surface and scanner characterization method", Proc. SPIE 2414, Device-Independent Color Imaging II, (10 April 1995); https://doi.org/10.1117/12.206536

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