High-performance 1K x 1K progressive scan imager

Chris J. Schaeffer; Holger Stoldt; Bart G. M. Dillen; Herman L. Peek; Willem Hoekstra; Jan van Dijk; E. Roks; Agnes C. M. Kleimann; Peter C. J. van de Rijt; Rik H. S. de Gruijter

doi:10.1117/12.206532

10 April 1995 High-performance 1K x 1K progressive scan imager

Chris J. Schaeffer, Holger Stoldt, Bart G. M. Dillen, Herman L. Peek, Willem Hoekstra, Jan van Dijk, E. Roks, Agnes C. M. Kleimann, Peter C. J. van de Rijt, Rik H. S. de Gruijter

Author Affiliations +

Proceedings Volume 2415, Charge-Coupled Devices and Solid State Optical Sensors V; (1995) https://doi.org/10.1117/12.206532
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1995, San Jose, CA, United States

Abstract

A frame transfer image sensor has been fabricated for 2/3' optical format. It has a high resolution (1024 X 1024), overexposure handling by means of vertical anti-blooming and square pixels of 7.5 micrometers by 7.5 micrometers . The data-rate is 30 frames per second. Its single output register can run up to 40 MHz. The register can be clocked bi-directionally, which makes it possible to produce a mirrored image. The noise level of the output amplifier is 31 electrons (rms value in 18 MHz bandwidth). These properties make the imager perfectly suited for machine vision applications where full resolution in a single shot is required. The paper describes the sensor, simulation results and measurements.

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Chris J. Schaeffer, Holger Stoldt, Bart G. M. Dillen, Herman L. Peek, Willem Hoekstra, Jan van Dijk, E. Roks, Agnes C. M. Kleimann, Peter C. J. van de Rijt, and Rik H. S. de Gruijter "High-performance 1K x 1K progressive scan imager", Proc. SPIE 2415, Charge-Coupled Devices and Solid State Optical Sensors V, (10 April 1995); https://doi.org/10.1117/12.206532

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