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I-V characteristics for a structure consisting of a silicon p+-n junction and a semiconductor-insulator-semiconductor structure obtained by spray deposition of In2O3:SnO2 (ITO) thin layer of on the surface of nSi have been obtained and investigated. In the case of direct biased p+nSi junction and reverse biased nSi-ITO structure a switching from high-resistance into low-resistance state occurs. The switching may be removed by voltage decreasing or illumination with white light. I-V characteristics for each junction have been investigated and a band diagram for the p+-nSi-ITO structure have been proposed. This diagram allows to explain the observed current switching as a result of the double injection in nSi region. These results show that the p+nSi-ITO structure possesses an S-type I-V characteristic, which may be controlled by voltage and by light. Unlike others S-type diodes in this case the illumination switches the structure from high-resistance into low-resistance state.
Ludmila S. Gagara,Elena A. Negru,Valentin Pleshka,Dormidont Sherban, andAlexei V. Simaschevici
"Light-controlled switching in p+nSi-ITO structures", Proc. SPIE 2461, ROMOPTO '94: Fourth Conference in Optics, (8 March 1995); https://doi.org/10.1117/12.203595
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Ludmila S. Gagara, Elena A. Negru, Valentin Pleshka, Dormidont Sherban, Alexei V. Simaschevici, "Light-controlled switching in p+nSi-ITO structures," Proc. SPIE 2461, ROMOPTO '94: Fourth Conference in Optics, (8 March 1995); https://doi.org/10.1117/12.203595