Integrated approach to focal plane array testing at the Arnold Engineering Development Center

Randy A. Nicholson; Kimberly D. Mead

doi:10.1117/12.210550

30 May 1995 Integrated approach to focal plane array testing at the Arnold Engineering Development Center

Randy A. Nicholson, Kimberly D. Mead

Proceedings Volume 2474, Smart Focal Plane Arrays and Focal Plane Array Testing; (1995) https://doi.org/10.1117/12.210550
Event: SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics, 1995, Orlando, FL, United States

Abstract

The Arnold Engineering Development Center (AEDC) has developed an extensive focal plane array (FPA) test capability that can be used to measure performance at the detector array or hybrid array level. The test capability has been developed around an integrated approach to sensor testing. A suite of test facilities has been developed to allow both radiometric calibration to be performed and mission simulation issues to be evaluated. The test facilities can be interfaced either to the FPA or to the array with its accompanying signal processing electronics. More than 100 FPAs of various sizes and types have been characterized to varying degrees in the AEDC FPA test facilities. Arrays designed for both strategic and tactical applications have been characterized. Numerous reports and data packages have been produced to document these tests. Extensive analysis of data acquired has been performed for a large number of arrays.

Citation Download Citation

Randy A. Nicholson and Kimberly D. Mead "Integrated approach to focal plane array testing at the Arnold Engineering Development Center", Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); https://doi.org/10.1117/12.210550

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