Calibration and characterization of HETG grating elements at the MIT X-Ray Grating Evaluation Facility

Kathryn A. Flanagan; Daniel Dewey; Leonard Bordzol

doi:10.1117/12.218400

1 September 1995 Calibration and characterization of HETG grating elements at the MIT X-Ray Grating Evaluation Facility

Kathryn A. Flanagan, Daniel Dewey, Leonard Bordzol

Proceedings Volume 2518, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI; (1995) https://doi.org/10.1117/12.218400
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

The high energy transmission grating spectrometer (HETGS) of the Advanced X-Ray Astrophysics Facility (AXAF) will include 336 gratings, of period 2000 angstrom and 4000 angstrom. The flight gratings have entered production, and preliminary tests for verification and calibration have begun. We present the current status of the x-ray tests at MIT, focusing on diffraction efficiency measurements and a grating tilt test. We indicate the direction the x ray testing will take in the near term.

Citation Download Citation

Kathryn A. Flanagan, Daniel Dewey, and Leonard Bordzol "Calibration and characterization of HETG grating elements at the MIT X-Ray Grating Evaluation Facility", Proc. SPIE 2518, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI, (1 September 1995); https://doi.org/10.1117/12.218400

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