Split shielding plates in electrostatic sector analyzers and Wien filters

Mikhail Igorevitch Yavor

doi:10.1117/12.221584

25 September 1995 Split shielding plates in electrostatic sector analyzers and Wien filters

Mikhail Igorevitch Yavor

Proceedings Volume 2522, Electron-Beam Sources and Charged-Particle Optics; (1995) https://doi.org/10.1117/12.221584
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

An analytical method is developed for calculation of the influence of the splitted shielding plates in inhomogeneous electrostatic sector analyzers and Wien filters on their electron optical properties. The method allows one to simplify considerably the choice of the mode of operation of the shielding plates needed to achieve a required electrostatic field distribution inside the analyzer.

Citation Download Citation

Mikhail Igorevitch Yavor "Split shielding plates in electrostatic sector analyzers and Wien filters", Proc. SPIE 2522, Electron-Beam Sources and Charged-Particle Optics, (25 September 1995); https://doi.org/10.1117/12.221584

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