Paper
6 September 1995 Thermal/temporal response of the NSOM probe/sample system
Hans D. Hallen, Boris I. Yakobson, Andres H. La Rosa, Michael A. Paesler
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Abstract
In measurements of sample temporal response with a near-field scanning optical microscope, or NSOM, one must account for the temporal response of the probe. The coupling of thermal and temporal effects in an NSOM fitted with a coated tapered fiber probe is considered. Study of the perturbation of cw infrared light by a pulse of visible light simultaneously sent through an illumination mode NSOM allows one to separate the relatively slow thermal response of the probe from the appreciably faster response of a silicon sample imaged with the probe. Temporal and thermal contrast in NSOM imaging are discussed in terms of the results.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hans D. Hallen, Boris I. Yakobson, Andres H. La Rosa, and Michael A. Paesler "Thermal/temporal response of the NSOM probe/sample system", Proc. SPIE 2535, Near-Field Optics, (6 September 1995); https://doi.org/10.1117/12.218693
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Near field scanning optical microscopy

Visible radiation

Silicon

Infrared imaging

Infrared radiation

Thermography

Modulation

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