Metrology applied to imaging systems

Philippe Millier; Max Andre Darizcuren

doi:10.1117/12.218303

1 September 1995 Metrology applied to imaging systems

Philippe Millier, Max Andre Darizcuren

Proceedings Volume 2549, Ultrahigh- and High-Speed Photography, Videography, and Photonics '95; (1995) https://doi.org/10.1117/12.218303
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

One of the most important objectives in nuclear tests is the precise and accurate measurement of the physical phenomena involved. Very fast and wide dynamic range imaging is among the multiple and other diagnostics used. A major development in scientific imaging is the increasing capabilities of diagnostic systems for gamma ray, X ray, visible and neutron spectra. However, the different sub-assemblies making up an imaging chain introduce a number of attenuations and distortions in the acquired image. The main objective of the work described here was the accurate measurement of these perturbations to correct the raw recorded image. For this, a test bench was set up and calibration methods were used to precisely adjust the spatial position of the imaging detector. To provide automation, all the instruments were controlled by a microcomputer. The quantities measured were: spatial uniformity, amplitude transfer function (linearity), background noise and noise on signal, geometric distortions, spectral response, 2D time aperture and 2D Modulation Transfer Function.

Citation Download Citation

Philippe Millier and Max Andre Darizcuren "Metrology applied to imaging systems", Proc. SPIE 2549, Ultrahigh- and High-Speed Photography, Videography, and Photonics '95, (1 September 1995); https://doi.org/10.1117/12.218303

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KEYWORDS

Cameras

Modulation transfer functions

Imaging systems

Image sensors

Sensors

Picosecond phenomena

Interference (communication)

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