Evaluation of Si:As and Si:Sb blocked-impurity-band detectors for SIRTF and WIRE

Jeffrey E. Van Cleve; Terry L. Herter; Randy Butturini; George E. Gull; James R. Houck; Bruce Pirger; Justin Schoenwald

doi:10.1117/12.221380

29 September 1995 Evaluation of Si:As and Si:Sb blocked-impurity-band detectors for SIRTF and WIRE

Jeffrey E. Van Cleve, Terry L. Herter, Randy Butturini, George E. Gull, James R. Houck, Bruce Pirger, Justin Schoenwald

Proceedings Volume 2553, Infrared Spaceborne Remote Sensing III; (1995) https://doi.org/10.1117/12.221380
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

Cryogenic telescopes in space offer dramatic reduction in thermal IR background flux. Outstanding performance in the areas of detector dark current, read noise, and radiation hardness are required to take full advantage of the sensitivity improvements possible with such facilities, especially in very low flux (2 to 100 photons/pixel/sec) applications such as the Infrared Spectrograph on SIRTF. We present our testing methods and our results on Si:As and Si:Sb block impurity band (BIB) detectors produced by Rockwell International for our SIRTF and WIRE applications. Remarkable recent results are the reduction of the multiple-sampling read noise to 30 electrons, reduction of dark current to 10 e^-/s for Si:As and 40 e^-/s for Si:Sb, the use of an antireflective coating to improve the detective quantum efficiency for Si:As, extension of the useful wavelength range of Si:Sb to 40 microns, and confirmation that lab data on a 50 s time scale can be extrapolated to integration times at least 10 times longer.

Citation Download Citation

Jeffrey E. Van Cleve, Terry L. Herter, Randy Butturini, George E. Gull, James R. Houck, Bruce Pirger, and Justin Schoenwald "Evaluation of Si:As and Si:Sb blocked-impurity-band detectors for SIRTF and WIRE", Proc. SPIE 2553, Infrared Spaceborne Remote Sensing III, (29 September 1995); https://doi.org/10.1117/12.221380

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