Paper
21 November 1995 First results of X-SAR interferometry
Joao R. Moreira, Marcus Schwaebisch, Gianfranco Fornaro, Riccardo Lanari, Richard Bamler, Dieter Just, U. Steinbrecher, H. Breit, M. Eineder, Giorgio Franceschetti, D. Geudtner, H. Rinkel
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Abstract
Repeat-pass interferometry data have been acquired during the first and second SIR-C/X-SAR missions in April and October 1994. This paper presents the first results from X-SAR interferometry on four different sites. The temporal separations were one day and six months. At two sites the coherence requirements were met, resulting in high quality interferograms. A digital elevation model has been derived. The limitations of the X-SAR interferometry are discussed.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joao R. Moreira, Marcus Schwaebisch, Gianfranco Fornaro, Riccardo Lanari, Richard Bamler, Dieter Just, U. Steinbrecher, H. Breit, M. Eineder, Giorgio Franceschetti, D. Geudtner, and H. Rinkel "First results of X-SAR interferometry", Proc. SPIE 2584, Synthetic Aperture Radar and Passive Microwave Sensing, (21 November 1995); https://doi.org/10.1117/12.227145
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KEYWORDS
Interferometry

Doppler effect

Synthetic aperture radar

Coherence (optics)

Interferometric synthetic aperture radar

Data acquisition

Coherence imaging

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