Paper
15 March 1996 Experiments on the pattern recognition system for validation and security verification
Bahram Javidi, Guanshen Zhang
Author Affiliations +
Proceedings Volume 2659, Optical Security and Counterfeit Deterrence Techniques; (1996) https://doi.org/10.1117/12.235453
Event: Electronic Imaging: Science and Technology, 1996, San Jose, CA, United States
Abstract
Experiments on an optical pattern recognition system used for validation and security verification are provided. The system verifies a random phase mask bonded to a gray scale primary image. Using a limited set of images, the system performance is investigated in the presence of different types of input noise and distortions such as scratches, fingerprints, and bendings. The experimental results indicate that for the noise and the distortion tested here, the system provides a good correlation performance by verifying the phase mask.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bahram Javidi and Guanshen Zhang "Experiments on the pattern recognition system for validation and security verification", Proc. SPIE 2659, Optical Security and Counterfeit Deterrence Techniques, (15 March 1996); https://doi.org/10.1117/12.235453
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KEYWORDS
Phase shift keying

Optical correlators

Amplitude modulation

Joint transforms

Charge-coupled devices

Fourier transforms

Optical pattern recognition

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