Life-testing oxide-confined VCSELs: too good to last?

Kevin L. Lear; Sean P. Kilcoyne; Richard P. Schneider Jr.; J. A. Nevers

doi:10.1117/12.237682

10 April 1996 Life-testing oxide-confined VCSELs: too good to last?

Kevin L. Lear, Sean P. Kilcoyne, Richard P. Schneider Jr., J. A. Nevers

Proceedings Volume 2683, Fabrication, Testing, and Reliability of Semiconductor Lasers; (1996) https://doi.org/10.1117/12.237682
Event: Photonics West '96, 1996, San Jose, CA, United States

Abstract

The use of native oxides (selective oxidation) in vertical cavity surface emitting lasers has produced dramatic improvements in these laser diodes but has also been suspected of causing poor reliability because of incidental reports of short lifetimes and physical considerations. Here we discuss the results of thousands of hours life-tests for oxide confined and implant confined devices at current densities from 1 to 12 kA/cm². There was a single infant mortality failure from a sample of 14 oxide confined lasers with the remainder showing relatively stable operation. The failed device is analyzed in terms of light current characteristics and near-field electroluminescence images, and potential screening criteria are proposed.

Citation Download Citation

Kevin L. Lear, Sean P. Kilcoyne, Richard P. Schneider Jr., and J. A. Nevers "Life-testing oxide-confined VCSELs: too good to last?", Proc. SPIE 2683, Fabrication, Testing, and Reliability of Semiconductor Lasers, (10 April 1996); https://doi.org/10.1117/12.237682

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