Comprehensive characterization of micro-arcing related particles

Yuri S. Uritsky; J. T. Pan; Terry Francis; C. R. Brundle

doi:10.1117/12.240417

27 May 1996 Comprehensive characterization of micro-arcing related particles

Yuri S. Uritsky, J. T. Pan, Terry Francis, C. R. Brundle

Proceedings Volume 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995; (1996) https://doi.org/10.1117/12.240417
Event: Laser-Induced Damage in Optical Materials: 1995, 1995, Boulder, CO, United States

There is no online version at this time. The PDF is only available to people who have bought the paper or have a subscription.

Citation Download Citation

Yuri S. Uritsky, J. T. Pan, Terry Francis, and C. R. Brundle "Comprehensive characterization of micro-arcing related particles", Proc. SPIE 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, (27 May 1996); https://doi.org/10.1117/12.240417

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available