The digitalization of CAD-models, the complete manufacturing control and the timely quality control of components are important tasks of modern industrial inspection. In many cases the 3D-object shape as well as its deviation from a certain master object is of special interest, whereas optical measuring techniques based on structured light find increasing application /1 - 4/. Unfortunately, as a rule the application of these optical 3D-inspection systems leads to difficulties if the surfaces under test are strongly structured yielding to a shadowing within the image field. Moreover, distortions appear if the detector records too high light intensities in some ranges of the image caused by light reflection and diffraction at the surface of the object. So, within these ranges of the image one could not get useful values of measurement of the coordinates. The method of structured illumination allows the development of a concept of measurement which can avoid these illumination-caused difficulties.
|