Lateral shearing interferometry with high accuracy

G. W. R. Leibbrandt

doi:10.1117/12.2316207

1 September 1996 Lateral shearing interferometry with high accuracy

G. W. R. Leibbrandt

Proceedings Volume 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology; 2778EE (1996) https://doi.org/10.1117/12.2316207
Event: 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 1996, Taejon, Korea, Republic of

Abstract

A phase-stepped lateral shearing interferometer is presented with the same accuracy as conventional interferometers. This is achieved among others by shearing over a substantial fraction of the wavefront diameter.

Citation Download Citation

G. W. R. Leibbrandt "Lateral shearing interferometry with high accuracy", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 2778EE (1 September 1996); https://doi.org/10.1117/12.2316207

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available