Paper
17 July 1996 Actively phase-compensated portable fiber optic electronic speckle pattern interferometer (ESPI) for long-term in-situ measurements
Alexander Brozeit, Klaus D. Hinsch
Author Affiliations +
Abstract
The design and performance of an actively phase-compensated fiber-optic speckle pattern interferometer (ESPI) is presented. Due to its portability, illuminating beam flexibility and lightweight design it provides an alternative to standard bulk-optics FSPI systems for many applications. Phase stabilization allows for long-term measurements up to several days. In addition, the provided phase stepping uses the four-step algorithm, is self calibrating, and can be performed at quasi video rate. The use of all highly birefringent fiber-optics components ensures linearly polarized light for the illuminating beams under all operating conditions.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander Brozeit and Klaus D. Hinsch "Actively phase-compensated portable fiber optic electronic speckle pattern interferometer (ESPI) for long-term in-situ measurements", Proc. SPIE 2860, Laser Interferometry VIII: Techniques and Analysis, (17 July 1996); https://doi.org/10.1117/12.276300
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Cited by 1 scholarly publication.
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KEYWORDS
Fiber optics

Phase shift keying

Interferometers

Fiber optics tests

Speckle pattern

Semiconductor lasers

Calibration

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