Fault detection and classification in and on transparent films by light scattering

Christo G. Stojanoff; Andreas Ante; Johannes K. Schaller

doi:10.1117/12.245171

19 July 1996 Fault detection and classification in and on transparent films by light scattering

Christo G. Stojanoff, Andreas Ante, Johannes K. Schaller

Proceedings Volume 2861, Laser Interferometry VIII: Applications; (1996) https://doi.org/10.1117/12.245171
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

A setup for the detection and classification of inhomogeneities (scatterers) in and on transparent films is described. The setup involves the illumination of the film by a laser light sheet. The light scattered off the film is imaged onto two linear CCD arrays. The polarization of the illuminating laser is circular and the two orthogonal linear components are filtered in front of the two CCD arrays. The CCD arrays detect the hh- and the vv-components of the scattered light, as cross-polarized scattering can be neglected. It is shown that the ratio of these two components depends for certain scattering angles on the type of scatterer. The aim of the investigations was to distinguish between dust and bubbles, the two major fault sources in thin gelatin films, the typical substratum for photographic and holographic films. The system was tested with hollow glass spheres and ragweed pollen as test scatterers. The hollow spheres behave as bubbles in the gelatin film Pollen were chosen to represent organic particles. The experimental results prove the validity of the assumed method and show an adequate characterization of the two types of scatterers provided they are at the surface of the investigated film. Statistical analysis of the experimental data show that the characterization quality is diminished if the scatterers are embedded in a gelatin layer, as not all scattering angles are observable due to total internal reflection of the scattered light.

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Christo G. Stojanoff, Andreas Ante, and Johannes K. Schaller "Fault detection and classification in and on transparent films by light scattering", Proc. SPIE 2861, Laser Interferometry VIII: Applications, (19 July 1996); https://doi.org/10.1117/12.245171

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KEYWORDS

Scattering

Light scattering

Glasses

Particles

Laser scattering

Polarization

Charge-coupled devices

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