Paper
24 September 1996 Cellular automata analysis of the structure of carrier lifetime and its multicausal nonlinear dependence in semiconductor lasers
Marziale Milani, Fabio Previdi
Author Affiliations +
Proceedings Volume 2886, Semiconductor Lasers II; (1996) https://doi.org/10.1117/12.251886
Event: Photonics China '96, 1996, Beijing, China
Abstract
The dependence of spontaneous carrier lifetime (tau) s suggests new experiments for the determination of microscopic parameters of the active region material. Cavity geometry's are time evolving structures due to the high non- linearities typical of the elementary processes involved. A computational approach basically different from the differential equation one, is being developed. The results obtained by this approach are compared with the analytical and the experimental ones, thus leading to the possible characterization of devices just at the wafer level. Finally complementary information are extracted from relaxation oscillations.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marziale Milani and Fabio Previdi "Cellular automata analysis of the structure of carrier lifetime and its multicausal nonlinear dependence in semiconductor lasers", Proc. SPIE 2886, Semiconductor Lasers II, (24 September 1996); https://doi.org/10.1117/12.251886
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Optical filters

Photons

Finite impulse response filters

Linear filtering

Electronic filtering

Reflectivity

Semiconductor lasers

RELATED CONTENT

Turbo LMS algorithm: Supercharger meets adaptive filter
Proceedings of SPIE (April 17 2006)
Noise extraction for Raman lidar signal processing
Proceedings of SPIE (March 21 2003)
Learning type of median and mean hybrid filters and a...
Proceedings of SPIE (April 06 1998)
Noise removal and deformation elimination
Proceedings of SPIE (May 08 2001)

Back to Top