Paper
15 November 1996 CT-assisted metrology for manufacturing applications
Robert N. Yancey, Dennis S. Eliasen, Roosevelt Gibson, Robert Dzugan
Author Affiliations +
Abstract
Computed tomography (CT) has been shown to be an excellent nondestructive evaluation tool for measuring internal and external dimensions of manufactured components. Recent advances in CT-based metrology allow for CT data to be processed efficiently to produce full 3D models of scanned parts. This paper will talk about a number of applications for this technology including linking CT with rapid prototyping methods, using CT and rapid prototyping to produce rapid tooling, using CT as a metrology tool in a production environment, and linking CT data with engineering analysis. The paper will provide an overview of the current state of the art in applying CT-based metrology to manufacturing applications, will discuss actual application case studies, and highlight areas for future work in this area.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert N. Yancey, Dennis S. Eliasen, Roosevelt Gibson, and Robert Dzugan "CT-assisted metrology for manufacturing applications", Proc. SPIE 2948, Nondestructive Evaluation for Process Control in Manufacturing, (15 November 1996); https://doi.org/10.1117/12.259203
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CITATIONS
Cited by 5 scholarly publications.
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KEYWORDS
Computer aided design

Solid modeling

Reverse modeling

Metrology

Data modeling

Reverse engineering

Computed tomography

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