Paper
25 April 1997 Parameter estimation in deformable models using Markov chain Monte Carlo
Vikram Chalana, David R. Haynor, Paul D. Sampson, Yongmin Kim
Author Affiliations +
Abstract
Deformable models have gained much popularity recently for many applications in medical imaging, such as image segmentation, image reconstruction, and image registration. Such models are very powerful because various kinds of information can be integrated together in an elegant statistical framework. Each such piece of information is typically associated with a user-defined parameter. The values of these parameters can have a significant effect on the results generated using these models. Despite the popularity of deformable models for various applications, not much attention has been paid to the estimation of these parameters. In this paper we describe systematic methods for the automatic estimation of these deformable model parameters. These methods are derived by posing the deformable models as a Bayesian inference problem. Our parameter estimation methods use Markov chain Monte Carlo methods for generating samples from highly complex probability distributions.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vikram Chalana, David R. Haynor, Paul D. Sampson, and Yongmin Kim "Parameter estimation in deformable models using Markov chain Monte Carlo", Proc. SPIE 3034, Medical Imaging 1997: Image Processing, (25 April 1997); https://doi.org/10.1117/12.274096
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Cited by 1 scholarly publication.
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KEYWORDS
Expectation maximization algorithms

Monte Carlo methods

Statistical analysis

Data modeling

Statistical modeling

Image segmentation

Medical imaging

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