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Recently, many researches on sensors have focused on sensor functions, but a few of them on sensor reliability. Screen technique for a sensor is important for ensuring the quality of a sensor. In the previous screen methods, the screen time is determined empirically and no suitable theory could apply for it, especially, in developing a new product. The method presented here can determine screen time quickly. In this paper, the relation between reliability life distribution of a sensor with initial failure and screen time was discussed. The failure data from life distribution's corner was dealt with computer and the life distribution curve was inferred. Finally, the screen time was determined by the study of the life distribution. To further interpret the new method, a practical example was given and a satisfy result was obtained.
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