Direct measurements of transient structures by means of time-resolved x-ray diffraction

Peilin Chen; Ivan V. Tomov; Peter M. Rentzepis

doi:10.1117/12.306132

24 April 1998 Direct measurements of transient structures by means of time-resolved x-ray diffraction

Peilin Chen, Ivan V. Tomov, Peter M. Rentzepis

Proceedings Volume 3273, Laser Techniques for Condensed-Phase and Biological Systems; (1998) https://doi.org/10.1117/12.306132
Event: Optoelectronics and High-Power Lasers and Applications, 1998, San Jose, CA, United States

Abstract

Nanosecond x-ray pulses have been used for time resolved x- ray diffraction to measure the transient structure of Pt and GaAs crystals caused by laser pulse heating. A direct imaging x-ray CCD system with high spatial resolution allows the detection for the lattice deformations of the order of 10^-4 A, induced by a laser pulse energy of a few millijoules.

Citation Download Citation

Peilin Chen, Ivan V. Tomov, and Peter M. Rentzepis "Direct measurements of transient structures by means of time-resolved x-ray diffraction", Proc. SPIE 3273, Laser Techniques for Condensed-Phase and Biological Systems, (24 April 1998); https://doi.org/10.1117/12.306132

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