Reliability aspects of 980-nm pump lasers in EDFA applications

Albert Oosenbrug

doi:10.1117/12.304447

7 April 1998 Reliability aspects of 980-nm pump lasers in EDFA applications

Albert Oosenbrug

Proceedings Volume 3284, In-Plane Semiconductor Lasers: from Ultraviolet to Mid-Infrared II; (1998) https://doi.org/10.1117/12.304447
Event: Optoelectronics and High-Power Lasers and Applications, 1998, San Jose, CA, United States

Abstract

The use of 980-nm laser diodes as pump sources in erbium-doped fiber amplifiers (EDFAs) offers better noise figures and larger useful optical bandwidth in comparison to the use of a 1480-nm pump sources. With many millions hours of operation in field deployment the reliability of the 980-nm pumped EDFAs has been proven to fulfill the requirements posed by the terrestrial telecommunication applications. The future WDM enhancements in telecommunications networking and the extension into the submarine systems will require higher operational power levels and will tighten the reliability budget of the 980-nm pumped EDFA systems. The 980-nm pump- laser reliability as available today will be reviewed and the status of the reliability engineering towards higher laser power levels and higher system confidence will be discussed.

Citation Download Citation

Albert Oosenbrug "Reliability aspects of 980-nm pump lasers in EDFA applications", Proc. SPIE 3284, In-Plane Semiconductor Lasers: from Ultraviolet to Mid-Infrared II, (7 April 1998); https://doi.org/10.1117/12.304447

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