Noise assessment for passive FT-IR spectrometer measurements

Roger J. Combs

doi:10.1117/12.317638

6 August 1998 Noise assessment for passive FT-IR spectrometer measurements

Roger J. Combs

Proceedings Volume 3383, Electro-Optical Technology for Remote Chemical Detection and Identification III; (1998) https://doi.org/10.1117/12.317638
Event: Aerospace/Defense Sensing and Controls, 1998, Orlando, FL, United States

Abstract

The spectroradiometric performance characteristics of a FT- IR spectrometer are evaluated as a function of temperature, optical mirror velocity, and spectral resolution. The noise equivalent radiance per root Hertz is used in these noise evaluations and is shown to be an important Michelson interferometer figure of merit.

Citation Download Citation

Roger J. Combs "Noise assessment for passive FT-IR spectrometer measurements", Proc. SPIE 3383, Electro-Optical Technology for Remote Chemical Detection and Identification III, (6 August 1998); https://doi.org/10.1117/12.317638

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