Simple refractometers for index measurements by minimum-deviation method from far ultraviolet to near infrared

Douglas B. Leviton; Timothy J. Madison; Peter Petrone III

doi:10.1117/12.326672

8 October 1998 Simple refractometers for index measurements by minimum-deviation method from far ultraviolet to near infrared

Douglas B. Leviton, Timothy J. Madison, Peter Petrone III

Author Affiliations +

Proceedings Volume 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials; (1998) https://doi.org/10.1117/12.326672
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

The focal shift of an optical filter used in non-collimated light depends directly on substrate thickness and index of refraction. The HST Advanced Camera for Surveys (ACS) requires a set of filters whose focal shifts are tightly matched. Knowing the index of refraction for substrate glasses allows precise substrate thicknesses to be specified. Two refractometers have been developed at the Goddard Space Flight Center (GSFC) to determine the indices of refraction of materials from which ACS filters are made. Modern imaging detectors for the near infrared, visible, and far ultraviolet spectral regions make these simple yet sophisticated refractometers possible. A new technology, high accuracy, angular encoder also developed at GSFC makes high precision index measurement possible in the vacuum ultraviolet by prism methods.

Citation Download Citation

Douglas B. Leviton, Timothy J. Madison, and Peter Petrone III "Simple refractometers for index measurements by minimum-deviation method from far ultraviolet to near infrared", Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, (8 October 1998); https://doi.org/10.1117/12.326672

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