Tunable 1.3- to 5-um wavelength target reflectance measurement system

Mohan Vaidyanathan; William F. Lynn; Wendy C. Shemano; Carl W. Schmidt; Paul F. McManamon

doi:10.1117/12.328108

16 October 1998 Tunable 1.3- to 5-μm wavelength target reflectance measurement system

Mohan Vaidyanathan, William F. Lynn, Wendy C. Shemano, Carl W. Schmidt, Paul F. McManamon

Proceedings Volume 3438, Imaging Spectrometry IV; (1998) https://doi.org/10.1117/12.328108
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

We describe a tunable, 1.3 to 5 micrometers wavelength reflectance measurement system using an optical parametric oscillator (OPO) as the light source. The OPO source consists of a 1 micrometers Nd:YAG laser which is frequently shifted to 1.3-5 micrometers wavelengths using a periodically poled lithium niobate nonlinear optical crystal. The system design, calibration, and measurement of the directional-hemispherical reflectance factor and the bi-directional reflectance distribution function of different target materials are presented.

Citation Download Citation

Mohan Vaidyanathan, William F. Lynn, Wendy C. Shemano, Carl W. Schmidt, and Paul F. McManamon "Tunable 1.3- to 5-μm wavelength target reflectance measurement system", Proc. SPIE 3438, Imaging Spectrometry IV, (16 October 1998); https://doi.org/10.1117/12.328108

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available