XMM flight mirror modules with reflection grating assembly and x-ray baffle testing

Yvan Stockman; Isabelle Domken; Hebert Hansen; Jean Philippe Tock; Todd R. Decker; Andrew P. Rasmussen; Antonius J. F. den Boggende; Jan-Willem den Herder; Frits B. S. Paerels; G. Bagnasco; Daniel de Chambure; Christian Erd; Philippe Gondoin

doi:10.1117/12.330313

10 November 1998 XMM flight mirror modules with reflection grating assembly and x-ray baffle testing

Yvan Stockman, Isabelle Domken, Hebert Hansen, Jean Philippe Tock, Todd R. Decker, Andrew P. Rasmussen, Antonius J. F. den Boggende, Jan-Willem den Herder, Frits B. S. Paerels, G. Bagnasco, Daniel de Chambure, Christian Erd, Philippe Gondoin

Author Affiliations +

Proceedings Volume 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX; (1998) https://doi.org/10.1117/12.330313
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

In the frame of the XMM project, several test campaigns are accomplished to qualify the optical elements of the mission. The test described in this paper are performed on a XMM flight model mirror module added with a reflection grating assembly (RGA). The mirror module contains 58 x-ray optical quality shells, an x-ray baffle (XRB) to reduce the straylight. This complete XMM flight model mirror assembly (MA) is tested in a vertical configuration at CSL, in a full aperture or partial EUV collimated beam illumination, and with an x-ray pencil beam. One of the advantages of the EUV collimated beam is to verify the correct position of the RGA when integrated in flight configuration on the mirror module structure. This is not possible in x-ray with a finite source distance. The partial EUV illumination is performed to verify the correct integration of the RGA grating stacks. The pencil beam allows to make an accurate metrology of the XRB position, and to verify the positions of the 0, 1 and 2 diffraction order foci. In this paper, the tested module is first exposed, and the approach to qualify the instrument is described. The analysis of the results achieved over the different test configurations is presented. The impact of the environmental test on the reflection grating box is also diagnosed.

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Yvan Stockman, Isabelle Domken, Hebert Hansen, Jean Philippe Tock, Todd R. Decker, Andrew P. Rasmussen, Antonius J. F. den Boggende, Jan-Willem den Herder, Frits B. S. Paerels, G. Bagnasco, Daniel de Chambure, Christian Erd, and Philippe Gondoin "XMM flight mirror modules with reflection grating assembly and x-ray baffle testing", Proc. SPIE 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX, (10 November 1998); https://doi.org/10.1117/12.330313

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